Oscillation-based test in bandpass oversampled A/D converters
نویسندگان
چکیده
This paper extends a study performed by the authors in previous papers dealing with the OBT approach applied to low-pass modulators ‘Microelectron. J. 33/10 (2002) 799’, showing herein the specific features associated to the bandpass case. A practical feedback strategy will be proposed in order to built an effective oscillator, which can be valuable for testing purposes. Critical points of the proposed OBT solution will be considered in order to establish useful guidelines to apply this test approach to generic bandpass SD modulators. q 2003 Elsevier Ltd. All rights reserved.
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عنوان ژورنال:
- Microelectronics Journal
دوره 34 شماره
صفحات -
تاریخ انتشار 2003